Then new SIM ICP 6000 is a simultaneous high resolution ICP-OES with wavelength range 120 to 850 nm allowing measurement of even Halogen elements (Cl, Br, I) down to ppb levels.
Featuring:
- Dual View – Radial and / or Axial view
- Solid State Detector
- Rowland Circle Design with linear CCDs
- Superior UV performance – upto 1000 times more sensitive compared to Echelle optics ICP-OES
- 40 MHz free running RF generator which can respond faster to changes in the plasma
- Allows direct aspiration of organic and oil samples without the need for oxygen accessories
- Ability to run high dissolved solid and slurries
- Choice of many more wavelengths compared to Echelle optics ICP-OES
- Lower stray light
- Plasma Camera for sample viewing
- Patented Plasma Integrity Protector (PIP) which significantly lowers occurrence of torch meltdowns